Agentic AI turns simple language into self-guided X-ray scans of microelectronics – Tech Xplore

Researchers have developed agentic AI technology that converts natural language instructions into autonomous X-ray scanning procedures for microelectronics inspection. The system enables users to direct detailed scanning operations through simple language commands rather than requiring specialized technical knowledge. This advancement could streamline quality control and analysis processes in microelectronics manufacturing and research environments.

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